Product Profile of High Sensitive Measurement System For Very Small Deformations

APM Technologies offers High Sensitive Measurement System for Very Small Deformations. APM Technologies also offers solutions in the field of Scanning and Deformation measurement. ATOS Scanning system and TRITOP photogrammetry systems offer scanning solution for a wide variety of components, while ARAMIS, ARGUS, PONTOS and ESPI address to different deformation needs. High Sensitive Measurement System for Very Small Deformations is well suited to measure smallest 3D displacements and plane strain with a resolution of approx. 10 nanometres or 1 micrometer per meter.

The high measuring resolution in the determination of deformation and strain is well suited for:

• Material testing

• Strength assessment

• Optimization of constructions

• Investigations of linear and non-linear behaviour. Characterization of creep and aging properties

• Verification of numerical simulations

• Characterization of heterogeneous materials