Product Profile of Analog/ Digital Type In-Circuit Tester
Analog/ Digital type In-Circuit Tester comes with per pin Programmable digital cards & a whole new set of intuitive software graphical user interfaces [GUIs] that makes programming and development effortless. The In-Circuit Tester of model number Agilent Medalist i1000 can perform digital PCF/VCL library based testing, Boundary Scan and I2C/SPI serial programming on a simple, low-cost long-wired test fixture. The In-Circuit Tester has digital subsystem that harnesses the simplicity and power to adjust test speeds, drive and receive voltages with just a few clicks of the mouse. The Analog/ Digital type In-Circuit Tester is designed to work on programmable power supply.
Key Features of Analog/ Digital Type In-Circuit Tester
- Ease of Use
- Simplified GUI
- Limited Access Solutions
- Maximum number of Nodes : 3456
- Lower Entry Cost
- Autodebug- (same as i3070)
- Vector Based Digital Test
- Autooptimize- (same as i3070)
- Powered and unpowered Analog Test
- VTEP v2.0 Powered Test Suite (Same as i3070)
- Frequency Measurement
- Cover Extended Technology (same as i3070)
- AC/DC Voltage Testing
- Network Paramater Measurement (same as i3070)
- Yield Enhancement Tool
- Automatic Guard
- Auto Re-test, Auto Test Cycle Repeat
- High Fault Coverage
- Bead probe technology
- ON board Programming (SPI & I2C)
- Programmable Power Supply
