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Pulsed Laser Diode Test System With 5A Pulse Capability

Pulsed Laser Diode Test System With 5A Pulse Capability

Product Category :    Electronic Testing And Measuring Instruments

Supplier                :    Keithley Instruments International Corporation

Key Features of Pulsed Laser Diode Test System with 5A Pulse Capability

  • Simplifies laser diode LIV testing prior to packaging or active temperature control
  • Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
  • Sweep can be programmed to stop on optical power limit


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Product Profile of Pulsed Laser Diode Test System with 5A Pulse Capability

Keithley Instruments manufactures Pulsed Laser Diode Test System with 5A Pulse Capability. Keithley Instruments is an ISO 9001:2000 ISO 14001 and ISO 17025 certified company. Pulsed Laser Diode Test System with 5A Pulse Capability is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. Pulsed Laser Diode Test System with 5A Pulse Capability provides all sourcing and measurement capabilities needed for pulsed and continuous light-current-voltage testing of laser diodes in one compact, half-rack instrument.

Key Features of Pulsed Laser Diode Test System with 5A Pulse Capability
  • Simplifies laser diode LIV testing prior to packaging or active temperature control
  • Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
  • Sweep can be programmed to stop on optical power limit
  • Combines high accuracy source and measure capabilities for pulsed and DC testing
  • Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
  • Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
  • Pulse capability up to 5A, DC capability up to 1A
  • 14-bit measurement accuracy on three measurement channels [VF, front photodiode, back photodiode]
  • Measurement algorithm increases the pulse measurement`s signal-to-noise ratio
  • Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
  • Digital I/O binning and handling operations
  • IEEE-488 and RS-232 interfaces
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