Quantum Equipment Co. Ltd. Offers Universal Coating Thickness & Material Analyser. This Material Analyser is a device used for elemental analysis, thickness measurements, on-line inspection, quality control applications and percentage determination of precious metals through micro spot X-ray tube technology. Quantum Equipment Co. Ltd. Is an ISO 9001:2000 certified company. Universal Coating Thickness & Material Analyser is available as `ComPact 5/pin`. It is designed for the inspection of electronic components and other precision parts. It offers a universal material and coating thickness analyser at a reasonable price/performance ratio. The use of a high resolution silicon semi-conductor detector makes the Universal Coating Thickness & Material Analyser an ideal tool for users who want best limits of detection and highest precision together with maximum flexibility. Compared with a conventional prop-counter the semiconductor detector offers about 4 times better separation of overlapping elements. The much higher peak to background ratio of the detector allows the analysis of very thin coatings, 10 times thinner as so far possible and also fast analysis due o latest digital signal measuring technique.
