Technosource International, Inc supplies Thin Film Reflectometry System. Technosource International, Inc offers process control, consumer electronics and medical diagnostics. The optical properties of thin films arise from reflection and interference. The NanoCalc Thin Film Reflectometry System allows analyzing the thickness of optical layers from 10 nm to~250 µm. One can observe a single thickness with a resolution of 0.1 nm. Depending on the software choice, user can analyze single-layer or multilayer films in less than one second and can measure the thickness and removal rates of semiconductor process films or anti-scratch coatings, hard coatings and anti-reflection coatings. The Thin Film Reflectometry System is ideal for in situ, and on-line thickness measurements.
