Technosource International, Inc offers Ellipsometer with 380-780 nm Standard Wavelength Range. Technosource International, Inc offers process control, consumer electronics and medical diagnostics. The Ellipsometer with 380-780 nm Standard Wavelength Range measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The Ellipsometer with 380-780 nm Standard Wavelength Range is controlled via a PC. It measures refractive index, absorbance and thickness with the touch of a button.
The SpecEl houses an integrated light source, a spectrometer and two polarizers fixed to 70°. It also includes a PC with a 32-bit Windows Operating System. The Ellipsometer with 380-780 nm Standard Wavelength Range can detect a single layer as thin as 0.1 nm and up to 5 µm thick. In addition, it can provide refractive indices to 0.005°.
