Product Profile of Thickness Measurement System With Parameter Setting Facility
Thickness Measurement System with Parameter Setting Facility is a device, designed for measuring the basis weight of the calendared flat foil. The Measurement System is designed for the contact less measurement of the basis weight of foils, layers or tubes made of paper, rubber, plastic, metal, glass and other materials or also of coating layers on films and textiles. The Measurement System is designed with auto and manual zero calibration facility. Thickness Measurement System with Parameter Setting Facility ensure that the calibration curve can be modified or configured and downloaded to the controller PLC or uploaded from PLC only after login.
Key Features of Thickness Measurement System With Parameter Setting Facility
- Parameter settings for any product could be viewed, added, edited or deleted after login.
- Calibration curve can be modified / configured and downloaded to the controller PLC or uploaded from plc only after login.
- Auto and manual zero calibration.
- User configurable correction factor.
- All the trends and bell curve can be viewed on line, or from current archive or from the selected monthly archive.
- Trends of thickness of the film in microns for three consecutive scans along with the average, minimum, maximum thickness values.
- Trends of thickness of the film for a selected scan.
- Trends of the sliding average thickness with minimum, maximum, average values of the thickness at any position.
- Trends of thickness of the film along the left, center and right zone of the roll width.
- Trends of thickness of the film along the length and width of the roll.
- Trends of thickness of the film at a specified position along the length [m].
- Bell curve of deviation in thickness of the roll VS quantity [number].
